IMPLEMENTATION OF MINIMIZED MARCH SR ALGORITHM IN A MEMORY BIST CONTROLLER
Memory Built-In Self-Test (MBIST) is essential in testing memories on a chip. Its efficiency depends on its fault coverage and the complexity of the algorithm used, which defines the test sequence to be applied to every cell of the memory under the test. This paper presents the implementation of a minimized-complexity March SR algorithm in an MBIST controller for detecting unlinked static faults in an SRAM. It was implemented as a User-Defined Algorithm (UDA), which was hard-coded in the MBIST controller. The simulations validated its functionality and fault detection ability, producing similar fault coverage as the initial March SR algorithm with a shorter test completion time.
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